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Journal Article PUBDB-2026-01011

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Diamond sensor qualification for beam position and intensity monitoring by measurements at the MID instrument of the European XFEL

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2026
Elsevier Science Amsterdam [u.a.]

Diamond and related materials 164, 113480 () [10.1016/j.diamond.2026.113480]
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Abstract: X-ray Free-Electron Lasers (XFELs) such as the European XFEL (EuXFEL) generate extremely brilliant, ultra-short X-ray pulses at megahertz repetition rates. Because the pulse energy, position, and temporal propertiesfluctuate strongly from pulse to pulse, precise, non-invasive, pulse-resolved diagnostics are essential for optimalbeam delivery and advanced experiments. This work demonstrates the use of electronic-grade single-crystalCVD (scCVD) diamond detectors in a duo-lateral electrode configuration as a high-speed, radiation-hard beam-position monitor and intensity detector for hard X-rays (> 20 keV), where conventional gas detectors loseefficiency. Two diamond detectors (different thicknesses) were tested at the Materials Imaging and Dynamics(MID) instrument of the EuXFEL. They successfully performed pulse-resolved beam position and intensitymeasurements at 2.25 MHz repetition rate. The position uncertainty was < 1 % of the beam size. Excellentagreement was observed both between the two diamond sensors and with reference detectors (gas ionizationchamber and X-ray imager). These results establish duo-lateral scCVD diamond detectors as a powerful,compact, and reliable diagnostic tool for high-repetition-rate hard X-ray FELs, enabling real-time beam-basedalignment and intra-pulse-train position feedback.

Classification:

Note: Corresponding author appears with European XFEL Affiliation

Contributing Institute(s):
  1. MID (XFEL_E1_MID)
Research Program(s):
  1. 6G13 - Accelerator of European XFEL (POF4-6G13) (POF4-6G13)
Experiment(s):
  1. Experiments at XFEL

Appears in the scientific report 2026
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 Record created 2026-03-20, last modified 2026-04-16