Calibration and characterization of the line-VISAR diagnostic at the HED-HIBEF instrument at the European XFEL

Descamps, Adrien; Hwang, H.; Volz, T. J.; Redmer, R.; Kim, J.; Norton, A.-M.; Bolme, C. A.; Higginbotham, A.; Ranjan, D.; Michelat, T.; Appel, K.; Coleman, A. L.; Comley, A. J.; Chantel, J.; Spindloe, C.; Nakatsutsumi, M.; Peake, D. J.; Sollier, A.; Prescher, C.; Coppari, F.; Hartley, N. J.; Belonoshko, A. B.; Errandonea, D.; Smith, R. F.; Cerantola, V.; Gorman, M. G.; Gonzalez, J. M.; Vinci, T.; Pandolfi, S.; Smith, J.; McGonegle, D.; McBride, E. E.; Savage, D. J.; Tracy, S. J.; Schoelmerich, M.; McHardy, J. D.; Banerjee, S.; Cowan, T. E.; Briggs, R.; Nguyen-Cong, K.; Masruri, M.; Wark, J. S.; Heighway, P. G.; Armstrong, M. R.; Ravasio, A.; Tschentscher, T.; Di Dio Cafiso, S.; Vennari, C. E.; Hernandez-Gomez, C.; Buakor, K.; Garcia, A. Laso; Singh, S.; Koester, P.; Galtier, E.; Suer, T-A.; Collins, G.; Antonelli, L.; Millot, M.; Mason, P.; Spear, J.; Dwivedi, A.; Randolph, L.; Phillips, J. P.; Gizzi, L.; Tang, M.; Strohm, C.; Cynn, H.; Schwinkendorf, J-P.; Crépisson, C.; Goede, S.; Hutchinson, T. M.; Collier, J.; Albertazzi, B.; McGuire, C.; Willman, J. T.; Toncian, T.; Santamaria-Perez, D.; Ozaki, N.; Tyldesley, M.; Höppner, H.; Preston, T. R.; McWilliams, R. S.; Morard, G.; Walsh, J. P. S.; Toncian, M.; Rips, J.; Pereira, K. A.; Kraus, D.; Husband, R. J.; Dorchies, F.; Eggert, J. H.; Bouffetier, V.; Benuzzi-Mounaix, A.; Gleason, A.; Lee, Y.; Oleynik, I. I.; Konopkova, Z.; Labate, L.; Pelka, A.; Harmand, M.; Nagler, B.; Duff, M. J.; Ginestet, H.; Butcher, T.; Lazicki, A. E.; Zastrau, U.; Stevenson, M.; Vorberger, J.; Massani, B.; McMahon, M. I.; Brambrink, E.; Wollenweber, L.; Krygier, A.; Baehtz, C.; Otzen, C.; Merkel, S.; Ball, O. B.; Cristoforetti, G.

doi:10.1063/5.0271027

Journal Article

PUBDB-2025-04815

Calibration and characterization of the line-VISAR diagnostic at the HED-HIBEF instrument at the European XFEL

Descamps, A. (Corresponding author)Extern*XFEL.EU* ; Hutchinson, T. M. ; Briggs, R. ; McBride, E. E.Extern* ; Millot, M. ; Michelat, T. ; Eggert, J. H. ; Albertazzi, B. ; Antonelli, L. ; Armstrong, M. R. ; Baehtz, C.Extern*XFEL.EU* ; Ball, O. B. ; Banerjee, S. ; Belonoshko, A. B. ; Benuzzi-Mounaix, A. ; Bolme, C. A. ; Bouffetier, V. ; Buakor, K. ; Butcher, T. ; Cerantola, V. ; Chantel, J. ; Coleman, A. L. ; Collier, J. ; Collins, G. ; Comley, A. J. ; Coppari, F. ; Cowan, T. E. ; Crépisson, C. ; Cristoforetti, G. ; Cynn, H. ; Di Dio Cafiso, S. ; Dorchies, F. ; Duff, M. J. ; Dwivedi, A. ; Errandonea, D. ; Galtier, E. ; Ginestet, H. ; Gizzi, L. ; Gleason, A. ; Goede, S. ; Gonzalez, J. M. ; Gorman, M. G. ; Harmand, M. ; Hartley, N. J. ; Heighway, P. G. ; Hernandez-Gomez, C. ; Higginbotham, A. ; Höppner, H. ; Husband, R. J.XFEL.EU*DESY* ; Hwang, H.Extern*XFEL.EU* ; Kim, J. ; Koester, P. ; Konopkova, Z.XFEL.EU* ; Kraus, D. ; Krygier, A. ; Labate, L. ; Garcia, A. L. ; Lazicki, A. E. ; Lee, Y. ; Mason, P.Extern*XFEL.EU* ; Masruri, M. ; Massani, B. ; McGonegle, D. ; McGuire, C. ; McHardy, J. D. ; McWilliams, R. S. ; Merkel, S. ; Morard, G.Extern* ; Nagler, B. ; Nakatsutsumi, M. ; Nguyen-Cong, K. ; Norton, A.-M. ; Oleynik, I. I. ; Otzen, C.Extern*XFEL.EU* ; Ozaki, N. ; Pandolfi, S. ; Peake, D. J. ; Pelka, A. ; Pereira, K. A. ; Phillips, J. P. ; Prescher, C.Extern* ; Preston, T. R. ; Randolph, L. ; Ranjan, D.XFEL.EU*DESY* ; Ravasio, A. ; Redmer, R. ; Rips, J. ; Santamaria-Perez, D. ; Savage, D. J. ; Schoelmerich, M. ; Schwinkendorf, J.-P. ; Singh, S. ; Smith, J. ; Smith, R. F. ; Sollier, A. ; Spear, J. ; Spindloe, C. ; Stevenson, M. ; Strohm, C.XFEL.EU*DESY* ; Suer, T.-A. ; Tang, M. ; Tschentscher, T. ; Toncian, M. ; Toncian, T. ; Tracy, S. J. ; Tyldesley, M. ; Vennari, C. E. ; Vinci, T. ; Volz, T. J. ; Vorberger, J. ; Walsh, J. P. S. ; Wark, J. S. ; Willman, J. T. ; Wollenweber, L. ; Zastrau, U. ; Brambrink, E. ; Appel, K.XFEL.EU* ; McMahon, M. I.

2025
AIP Publishing [Melville, NY]

Review of scientific instruments 96(7), 075206 (2025) [10.1063/5.0271027]

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Please use a persistent id in citations: doi:10.1063/5.0271027 doi:10.3204/PUBDB-2025-04815

Abstract: In dynamic-compression experiments, the line-imaging Velocity Interferometer System for Any Reflector (VISAR) is a well-established diagnostic used to probe the velocity history, including wave profiles derived from dynamically compressed interfaces and wavefronts, depending on material optical properties. Knowledge of the velocity history allows for the determination of the pressure achieved during compression. Such a VISAR analysis is often based on Fourier transform techniques and assumes that the recorded interferograms are free from image distortions. In this paper, we describe the VISAR diagnostic installed at the HED-HIBEF instrument located at the European XFEL along with its calibration and characterization. It comprises a two-color (532, 1064 nm), three-arm (with three velocity sensitivities) line imaging system. We provide a procedure to correct VISAR images for geometric distortions and evaluate the performance of the system using Fourier analysis. We finally discuss the spatial and temporal calibrations of the diagnostic. As an example, we compare the pressure extracted from the VISAR analysis of shock-compressed polyimide and silicon.

Classification:

ddc:620

Note: cc-by

Contributing Institute(s):

Research Program(s):

631 - Matter – Dynamics, Mechanisms and Control (POF4-631) (POF4-631)

Experiment(s):

XFEL Beamline SASE 2 (XFEL)

Appears in the scientific report 2025

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Medline

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; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; National-Konsortium ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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Private Collections > >DESY > >FS > FS-HIBEF
Private Collections > >XFEL.EU > XFEL_E1_HED
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Record created 2025-11-11, last modified 2026-01-08

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