| Home > Publications database > X-ray near-field multi-slice ptychography for in-situ imaging |
| Typ | Amount | VAT | Currency | Share | Status | Cost centre |
| APC | 1864.65 | 6.53 | EUR | 94.91 % | (DEAL) | 810 / 476152 |
| Payment fee | 100.00 | 0.35 | EUR | 5.09 % | (Bestellt) | 810 / 476152 |
| APC | -1400.00 | 0.00 | EUR | -71.26 % | (Storniert) | 810 / 476152 |
| APC | 1400.00 | 0.00 | EUR | 71.26 % | (Bestellt) | 28902 / 476152 |
| Sum | 1964.65 | 6.88 | EUR | |||
| Total | 1971.53 |
| Journal Article | PUBDB-2025-01919 |
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2025
Springer Nature
[London]
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Please use a persistent id in citations: doi:10.1038/s41598-025-15610-8 doi:10.3204/PUBDB-2025-01919
Abstract: In-situ imaging of chemical reactions can provide valuable insight into nanoparticle growth and structural evolution. Hard X-ray imaging is an excellent tool for this purpose, as it combines high spatial resolution with high penetration depth, allowing for realistic reaction environments. While far-field ptychography is a well-established method at synchrotron radiation sources, its near-field analog has received less attention. In this work we show that near-field multi-slice ptychography is a competitive method for high-resolution in-situ imaging by studying the formation of gold nanocages via galvanic replacement. Our work extends near-field X-ray ptychography to sub-50 nm spatial resolution by using multilayer Laue lenses. These high numerical aperture optics enable to distinguish sample layers that are separated by less than 100 µm by multi-slicing techniques.
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