| Home > Publications database > X-ray reflectivity from micrometre-scaled surfaces using nanobeams |
| Typ | Amount | VAT | Currency | Share | Status | Cost centre |
| Hybrid-OA | 3150.00 | 0.00 | EUR | 96.92 % | (DEAL) | 810 / 476152 |
| Payment fee | 100.00 | 0.35 | EUR | 3.08 % | (Bestellt) | 810 / 476152 |
| Sum | 3250.00 | 0.35 | EUR | |||
| Total | 3250.35 |
| Journal Article | PUBDB-2025-01691 |
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2025
Munksgaard
Copenhagen
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Please use a persistent id in citations: doi:10.1107/S1600576725008179 doi:10.3204/PUBDB-2025-01691
Abstract: Sample and diffractometer alignment for grazing-incidence x-ray measurements become ever more crucial once the beam and surface area of interest reach the nanometre scale. Here we show how a point of interest on a surface can be kept in the beam while measuring x-ray reflectivity, even if it is not in the centre of rotation, either by systematic errors or by additional unwanted angle-dependent sample movement. This can be achieved by a 1D trajectory scan varying the angle of incidence ($\theta$), the detector angle ($2\theta$) and the position of the sample along one axis in the scattering plane. As an example we show the results of x-ray reflectivity measured from a 10$\times$10 $\mu$m$^2$ Au island using a 90 nm beam. Data analysis is presented which considers the angle-dependent x-ray beam footprint illuminating both the Au island and the surrounding support.
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