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Journal Article PUBDB-2025-01691

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X-ray reflectivity from micrometre-scaled surfaces using nanobeams

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2025
Munksgaard Copenhagen

Journal of applied crystallography 58(6), 1978 - 1985 () [10.1107/S1600576725008179]
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Abstract: Sample and diffractometer alignment for grazing-incidence x-ray measurements become ever more crucial once the beam and surface area of interest reach the nanometre scale. Here we show how a point of interest on a surface can be kept in the beam while measuring x-ray reflectivity, even if it is not in the centre of rotation, either by systematic errors or by additional unwanted angle-dependent sample movement. This can be achieved by a 1D trajectory scan varying the angle of incidence ($\theta$), the detector angle ($2\theta$) and the position of the sample along one axis in the scattering plane. As an example we show the results of x-ray reflectivity measured from a 10$\times$10 $\mu$m$^2$ Au island using a 90 nm beam. Data analysis is presented which considers the angle-dependent x-ray beam footprint illuminating both the Au island and the surrounding support.

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Note: Additional funding + Proposal Number1) German Federal Ministry of Education and Research (BMBF) and the Ministry of Economic Affairs, Industry, Climate Action and Energy of the State of North Rhine-Westphalia through the project HC–H2. 2) European Union’s Horizon Europe research and innovation programme under grant agreement No 101104032—OPINCHARGE3)ESRF Proposal no. MI-1496

Contributing Institute(s):
  1. Nanolab (FS-NL)
  2. The European X-Ray Laser Project XFEL (XFEL)
  3. The European XFEL Users (XFEL-User)
Research Program(s):
  1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)
  2. OPINCHARGE - OPerando analyses and modelling of INterface dynamics and CHARGE transport in lithium-ion batteries (101104032) (101104032)
Experiment(s):
  1. Measurement at external facility

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Medline ; Creative Commons Attribution CC BY 4.0 ; OpenAccess ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; DEAL Wiley ; Ebsco Academic Search ; Essential Science Indicators ; IF >= 5 ; JCR ; NationallizenzNationallizenz ; PubMed Central ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection
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Private Collections > >XFEL.EU > XFEL-User
Document types > Articles > Journal Article
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 Record created 2025-05-16, last modified 2026-03-24


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