Preprint

PUBDB-2025-00863

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Ultimate Sensitivity in X-ray Diffraction: Angular Moments vs. Shot Noise

Modregger, P. (Corresponding author)Extern* ; Wittwer, F.XFEL.EU*DESY* ; Khaliq, A.Extern* ; Pyrlik, N.Extern*DESY* ; Ball, J. A. D.Extern* ; Garrevoet, J.DESY* ; Falkenberg, G.DESY* ; Liehr, A.Extern* ; Stuckelberger, M.XFEL.EU*DESY*

2025

This record in other databases:

Report No.: arXiv:2502.17977

Abstract: The sensitivity of x-ray diffraction experiments towards Bragg peak parameters constitutes a crucial performance attribute of experimental setups. Frequently, diffraction peaks are characterized by model-free angular moment analysis, which offers a greater versatility compared to traditional model-based peak fitting. Here, we have determined the ultimate sensitivity of angular moments for diffraction data that is limited by photon shot noise. We report experimentally achieved sensitivities of the first moment below $1/1000$th of a detector pixel and below $1\mu$rad. We have demonstrated the validity of our theoretical predictions by an excellent agreement with experimental results from three different setups. The provided formulas for the uncertainties of angular moments allow for the rapid determination of experimentally achieved sensitivities from single diffraction frames.

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Contributing Institute(s):

1. FS-PETRA (FS-PETRA)
2. DOOR-User (DOOR ; HAS-User)
3. externe Institute im Bereich Photon Science (USiegen)

Research Program(s):

1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)
2. 6G3 - PETRA III (DESY) (POF4-6G3) (POF4-6G3)
3. 05K22PS2 - Schnelle Röntgennanodiffraktion (BMBF-05K22PS2) (BMBF-05K22PS2)
4. FS-Proposal: I-20231255 (I-20231255) (I-20231255)

Experiment(s):

1. PETRA Beamline P06 (PETRA III)

Appears in the scientific report 2025

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Database coverage:
Published

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Linked articles:

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Modregger, P.Extern* ; Wittwer, F. ; Khaliq, A. ; Pyrlik, N.Extern*DESY* ; Ball, J. A. D. ; Garrevoet, J.DESY* ; Falkenberg, G.DESY* ; Liehr, A. ; Stuckelberger, M.XFEL.EU*DESY*
Ultimate sensitivity in X-ray diffraction: angular moments versus shot noise
Journal of applied crystallography 58(5), NNN (2025) [10.1107/S1600576725006715]2025     Files  Fulltext by arXiv.org BibTeX | EndNote: XML, Text | RIS

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