| Home > Publications database > Laser-free and low-jitter Electro-Optic Sampling of FEL-based THz radiation by intrinsic ultrafast laserlike-pulses at FLASH |
| Typ | Amount | VAT | Currency | Share | Status | Cost centre |
| Hybrid-OA | 2575.00 | 0.00 | EUR | 96.26 % | (DEAL) | 810 / 476152 |
| Payment fee | 100.00 | 0.35 | EUR | 3.74 % | (Bestellt) | 810 / 476152 |
| Sum | 2675.00 | 0.35 | EUR | |||
| Total | 2675.35 |
| Contribution to a conference proceedings/Journal Article | PUBDB-2025-00520 |
; ; ; ;
2025
Elsevier Science
Amsterdam [u.a.]
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Please use a persistent id in citations: doi:10.1016/j.infrared.2025.106121 doi:10.3204/PUBDB-2025-00520
Abstract: The FLASH1 THz beamline at DESY produces intense multicycle THz undulator radiation, along with quasi-single cycle edge radiation. Characterizing the temporal profile of THz radiation generated by free-electron lasers (FELs) is challenging due to unavoidable timing jitter between the THz pulse and an external laser synchronized to the FEL master clock. Although Electro-Optic Sampling (EOS) is a powerful diagnostic technique for the FEL THz sources, this jitter limits the temporal resolution and spectral bandwidth, necessitating timing jitter correction. To address this, we introduce a laser-free and low-jitter diagnostic method, Afterburner EOS (ABEOS), which uses broadband laserlike-pulses generated with the THz radiation as a probe. ABEOS results demonstrate good consistency with simulations across two probe configurations: a sequence of 10 pulses and a single pulse. Furthermore, comparisons with conventional methods of scanning EOS with an external laser, single-shot EOS (SSEOS), and FTIR show strong and reliable agreement. This technique offers ’laser-free and low-jitter’ THz waveform characterization as a simplified, accurate, and reliable alternative to conventional THz diagnostics, validated up to 2 THz with potential for application at higher frequencies.
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