guest ::
| Home > Publications database > Investigating Gold Deposition with High-Power Impulse Magnetron Sputtering and Direct-Current Magnetron Sputtering on Polystyrene, Poly-4-vinylpyridine, and Polystyrene Sulfonic Acid |
| Home > Publications database > Investigating Gold Deposition with High-Power Impulse Magnetron Sputtering and Direct-Current Magnetron Sputtering on Polystyrene, Poly-4-vinylpyridine, and Polystyrene Sulfonic Acid |
| Typ | Amount | VAT | Currency | Share | Status | Cost centre |
| Hybrid-OA | 0.00 | 0.00 | EUR | 0.00 % | (Publish and Read) | 810 / 476152 |
| Cover | 1524.25 | 14.48 | EUR | 100.00 % | (Zahlung erfolgt) | 85300 |
| Hybrid-OA | -700.00 | 0.00 | EUR | -45.92 % | (Storniert) | 810 / 476152 |
| Hybrid-OA | 700.00 | 0.00 | EUR | 45.92 % | (Zahlung erfolgt) | 810 / 476152 |
| Sum | 1524.25 | 14.48 | EUR | |||
| Total | 1538.73 |
| Journal Article | PUBDB-2025-00058 |
; ; ; ; ; ; ; ; ; ; ; ; ; ;
2024
ACS Publ.
Washington, DC
This record in other databases: 
Please use a persistent id in citations: doi:10.1021/acs.langmuir.4c02344 doi:10.3204/PUBDB-2025-00058
Abstract: Fabricating thin metal layers and particularly observingtheir formation process in situ is of fundamental interest to tailor thequality of such a layer on polymers for organic electronics. Inparticular, the process of high power impulse magnetron sputtering(HiPIMS) for establishing thin metal layers has sparsely been exploredin situ. Hence, in this study, we investigate the growth of thin gold(Au) layers with HiPIMS and compare their growth with thin Aulayers prepared by conventional direct current magnetron sputtering(dcMS). Au was chosen because it is an inert noble metal and has ahigh scattering length density. This allows us to track the growingnanostructures via grazing incidence scattering. In particular, Audeposition on the polymer polystyrene (PS) with the respectivestructural analogues poly-4-vinlypyridine (P4VP) and polystyrenesulfonic acid (PSS) is studied. Additionally, the nanostructured layers on these different polymer films are further probed by fieldemission scanning electron microscopy (FESEM), atomic force microscopy (AFM), X-ray reflectometry (XRR), and four-pointprobe measurements. We report that HiPIMS leads to smaller island-to-island distances throughout the whole sputter process.Moreover, an increased cluster density and an earlier percolation threshold are achieved compared to dcMS. Additionally, in theearly stage, we observe a significant increase in coverage by HiPIMS, which is favorable for the improvement of the polymer−metalinterface.
; 
; 
; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; Nationallizenz
; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection
|
The record appears in these collections: |
PDF
PDF (PDFA)