Home > Publications database > Experimental qualification and modelling of the non-linear response of the DEPFET active pixel sensor for the DSSC camera |
Journal Article | PUBDB-2024-06948 |
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2024
North-Holland Publ. Co.
Amsterdam
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Please use a persistent id in citations: doi:10.1016/j.nima.2024.169757 doi:10.3204/PUBDB-2024-06948
Abstract: A modified Depleted P-Channel Field Effect Transistor (DEPFET) is the key feature of the DEPFET Sensorwith Signal Compression (DSSC), a 1 Mpixel X-ray camera aiming at ultra-fast imaging of soft X-rays at theEuropean XFEL. Operation of large-area devices with a large number of DSSC-type DEPFET pixels requiresthe accurate knowledge of the sensitivity of the response to the relevant DEPFET parameters. The paperpresents the experimental qualification of the response of DSSC-type DEPFET pixels in the space of 4 relevantparameters: drain current, source voltage, drain voltage and back side voltage. The obtained results allowestimation of the impact of the inevitable parameter fluctuations in large monolithic sensors and of the actualtrimming range of the shape of signal compression in view of the pixelwise calibration of the 1 Mpixel DSSCcamera.
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