Journal Article PUBDB-2024-00037

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X-ray multibeam ptychography at up to 20 keV: nano-lithography enhances X-ray nano-imaging

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2024
Wiley-VCH Weinheim

Advanced science 11(30), 2310075 () [10.1002/advs.202310075]
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Abstract: Hard X-rays are needed for non-destructive nano-imaging of solid matter. Synchrotron radiation facilities (SRF) provide the highest-quality images with single-digit nm resolution using advanced techniques such as X-ray ptychography. However, the resolution or field of view is ultimately constrained by the available coherent flux. To address this, the beam's incoherent fraction can be exploited using multiple parallel beams in an X-ray multibeam ptychography (MBP) approach. This expands the domain of X-ray ptychography to larger samples or more rapid measurements. Both qualities favor the study of complex composite or functional samples, such as catalysts, energy materials, or electronic devices. The challenge of performing ptychography at high energy and with many parallel beams must be overcome to extract the full advantages for extended samples while minimizing beam attenuation. Here, that challenge is overcome by creating a lens array using cutting-edge laser printing technology and applying it to perform scanning with MBP with up to 12 beams and at photon energies of 13 and 20 keV. This exceeds the measurement limits of conventional hard X-ray ptychography without compromising image quality for various samples: Siemens star test pattern, Ni/Al$_2$O$_3$ catalyst, microchip, and gold nano-crystal clusters.

Classification:

Contributing Institute(s):
  1. DOOR-User (DOOR ; HAS-User)
  2. FS-PETRA (FS-PETRA)
  3. Experimentebetreuung PETRA III (FS-PET-S)
Research Program(s):
  1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)
  2. 6G3 - PETRA III (DESY) (POF4-6G3) (POF4-6G3)
  3. SWEDEN-DESY - SWEDEN-DESY Collaboration (2020_Join2-SWEDEN-DESY) (2020_Join2-SWEDEN-DESY)
  4. SFB 1441 C03 - Chemische Bildgebung von strukturierten Katalysatoren mittels hochauflösender Röntgen-mikroskopie und Tomographie (C03) (446709595) (446709595)
  5. DFG project G:(GEPRIS)390761711 - EXC 2082: 3D Designer Materialien (390761711) (390761711)
Experiment(s):
  1. PETRA Beamline P06 (PETRA III)

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 Record created 2024-01-03, last modified 2025-08-04