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| Journal Article | PUBDB-2023-07140 |
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2023
Optica
Washington, DC
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Please use a persistent id in citations: doi:10.1364/OE.481776 doi:10.3204/PUBDB-2023-07140
Abstract: Methods of ablation imprints in solid targets are widely used to characterize focusedX-ray laser beams due to a remarkable dynamic range and resolving power. A detailed descriptionof intense beam profiles is especially important in high-energy-density physics aiming at nonlinearphenomena. Complex interaction experiments require an enormous number of imprints to becreated under all desired conditions making the analysis demanding and requiring a huge amountof human work. Here, for the first time, we present ablation imprinting methods assistedby deep learning approaches. Employing a multi-layer convolutional neural network (U-Net)trained on thousands of manually annotated ablation imprints in poly(methyl methacrylate), wecharacterize a focused beam of beamline FL24/FLASH2 at the Free-electron laser in Hamburg.The performance of the neural network is subject to a thorough benchmark test and comparisonwith experienced human analysts. Methods presented in this Paper pave the way towards a virtualanalyst automatically processing experimental data from start to end.
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