| Home > Publications database > High-resolution XEOL spectroscopy setup at the X-ray absorption spectroscopy beamline P65 of PETRA III |
| Journal Article | PUBDB-2022-06302 |
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2022
Wiley-Blackwell
[S.l.]
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Please use a persistent id in citations: doi:10.1107/S1600577522007287 doi:10.3204/PUBDB-2022-06302
Abstract: A newly designed setup to perform steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous XEOL and X-ray absorption spectroscopy characterization at beamline P65 of PETRA III is described. The XEOL setup is equipped with a He-flow cryostat and state-of-the-art optical detection system, which covers a wide wavelength range of 300–1700 nm with a high spectral resolution of 0.4 nm. To demonstrate the setup functioning, low-temperature XEOL studies on polycrystalline CuInSe2 thin film, single-crystalline GaN thin film and single-crystalline ZnO bulk semiconductor samples are performed.
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