Journal Article PUBDB-2022-03985

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Scanning high-sensitive x-ray polarization microscopy

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2022
IOP [London]

New journal of physics 24(5), 053051 - () [10.1088/1367-2630/ac6e80]
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Abstract: We report on the realization of an extremely sensitive x-ray polarization microscope, allowing to detect tiniest polarization changes of 1 in 100 billion (10−11) with a μm-size focused beam. The extreme degree of polarization purity places the most stringent requirements on the orientation of the polarizer and analyzer crystals as well as the composition and the form fidelity of the lenses, which must not exhibit any birefringence. The results show that these requirements are currently only met by polymer lenses. Highly sensitive scanning x-ray polarization microscopy thus is established as a new method. It can provide new insights in a wide range of applications ranging from quantum electrodynamics and quantum optics to x-ray spectroscopy, materials research, and laser physics.

Classification:

Contributing Institute(s):
  1. DOOR-User (DOOR ; HAS-User)
  2. Uni Jena (Uni Jena)
  3. Experimentebetreuung PETRA III (FS-PET-S)
Research Program(s):
  1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)
  2. 6G3 - PETRA III (DESY) (POF4-6G3) (POF4-6G3)
Experiment(s):
  1. PETRA Beamline P01 (PETRA III)

Appears in the scientific report 2022
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 Record created 2022-07-25, last modified 2025-07-24


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