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Journal Article | PUBDB-2021-02151 |
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2021
Wiley-Blackwell
[S.l.]
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Please use a persistent id in citations: doi:10.1107/S1600577521003805 doi:10.3204/PUBDB-2021-02151
Abstract: The IRIXS spectrograph represents a new design of a ultra high-resolution resonant inelastic X-ray scattering (RIXS) spectrometer that operates at the Ru L3-edge(2840 eV). First proposed in the field of hard X-rays by Shvyd'ko (2015), the X-ray spectrograph uses a combination of laterally graded multilayer mirrors and collimating/dispersing Ge(111) crystals optics in a novel spectral imaging approach to overcome the energy resolution limitation of a traditional Rowland-type spectrometer(Gretarsson et al., 2020). In combination with a dispersionless nested four-bounce high resolution monochromator design that utilizes Si(111) and Al$_2$O$_3$(110) crystals,we achieve an overall energy resolution better than 35 meV full width at half maximum (FWHM) at the Ru L$_3$-edge, in excellent agreement with ray tracing simulations.
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