Journal Article

PUBDB-2020-02513

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Measurements of Single Event Upset in ATLAS IBL

Balbi, G. ; Barbero, M. ; Beccherle, R. ; Bindi, M. ; Breugnon, P. ; Butti, P. ; Cinca, D. ; Dickinson, J. ; Ferrere, D. ; Fougeron, D. ; Garcia-Sciveres, M. ; Garcia Pascual, J. ; Gaudiello, A. ; Gemme, C. ; Giangiacomi, N. ; Hemperek, T. ; Jeanty, L. ; Kepka, O. ; Kocian, M. ; Lantzsch, K. ; Liu, P. ; Martin, C. ; Mekkaoui, A. ; Menouni, M. ; Potamianos, K.DESY* ; Takubo, Y. ; Rozanov, A. (Corresponding author)

2020
Inst. of Physics London

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Please use a persistent id in citations: doi:10.1088/1748-0221/15/06/P06023  doi:10.3204/PUBDB-2020-02513

Report No.: arXiv:2004.14116

Abstract: Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops in the low voltage currents, noisy pixels, and silent pixels. Quantitative data analysis and simulations indicate that SET dominate over SEU on the load line of the memory. Operational issues and mitigation techniques are presented.

Keyword(s): semiconductor detector: pixel ; ATLAS ; noise ; electronics: readout ; integrated circuit ; performance ; detector: design ; electronics: design ; signal processing ; numerical calculations

Note: 30 pages with 32 figures

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Contributing Institute(s):

1. LHC/ATLAS Experiment (ATLAS)

Research Program(s):

1. 611 - Fundamental Particles and Forces (POF3-611) (POF3-611)

Experiment(s):

1. LHC: ATLAS

Appears in the scientific report 2020

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; Essential Science Indicators ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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