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| Journal Article | PUBDB-2020-02432 |
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2020
AIP Publishing LLC
Melville, NY
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Please use a persistent id in citations: doi:10.1063/4.0000006 doi:10.3204/PUBDB-2020-02432
Abstract: We have recorded the diffraction patterns from individual xenon clusters irradiated with intense extreme ultraviolet pulses to investigate theinfluence of light-induced electronic changes on the scattering response. The clusters were irradiated with short wavelength pulses in thewavelength regime of different 4d inner-shell resonances of neutral and ionic xenon, resulting in distinctly different optical properties fromareas in the clusters with lower or higher charge states. The data show the emergence of a transient structure with a spatial extension of tensof nanometers within the otherwise homogeneous sample. Simulations indicate that ionization and nanoplasma formation result in a light-induced outer shell in the cluster with a strongly altered refractive index. The presented resonant scattering approach enables imaging ofultrafast electron dynamics on their natural timescale.
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