Journal Article

PUBDB-2016-03056

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Field Emission Beam Characteristics of Single Metal Nanotip Cathodes with On-Chip Collimation Gate Electrode

Lee, C. (Corresponding author)CFEL*MPG* ; Kanungo, P. D. ; Guzenko, V. ; Hefenstein, P. ; Miller, R. J. D.Extern* ; Tsujino, S. (Corresponding author)

2015
Inst. New York, NY

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Please use a persistent id in citations: doi:10.1116/1.4913397

Abstract: Field-emission and beam collimation characteristics of single metal nanotip devices with double-gate electrodes are studied. Applying a previously developed method to fabricate all-metal double-gate nanotip arrays with a stacked on-chip extraction G$_{ext}$ and collimation G$_{col}$ gate electrodes with the large G$_{col}$ apertures, the authors produced single double-gate nanotip devices and measured their beam characteristics. Excellent beam collimation capability with minimal reduction of the emission current and the enhancements of the current density up to a factor of ∼7 was observed. The results indicate that these single nanotip devices are highly promising for electron beam applications that require extremely high brilliance and coherence.

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Contributing Institute(s):

1. Forschungsgruppe für strukturelle Dynamik (MPSD)

Research Program(s):

1. 899 - ohne Topic (POF3-899) (POF3-899)

Experiment(s):

1. No specific instrument

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Database coverage:
; ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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