Journal Article

PUBDB-2015-01368

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png XAFS and XPS Analysis of $Zn_{0.98}Fe_{0.02}Te_{0.91}Se_{0.09}$ Semiconductor

Radisavljević, I. (Corresponding Author)>Extern* ; Trigueiro, J. ; Bundaleski, N. ; Medić, M. ; Romčević, N. ; Teodoro, O. M. N. D. ; Mitrić, M. ; Ivanović, N.>Extern*

2015
Elsevier Lausanne

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Please use a persistent id in citations: doi:10.1016/j.jallcom.2015.01.169

Abstract: Local structures and electronic properties of II–VI quaternary Zn 0.98 Fe 0.02 Te 0.91 Se 0.09 mixed crystal arestudied by X-ray absorption fine structure (XAFS) while the surface composition and its oxidation inair are studied by X-ray photoelectron spectroscopy (XPS). That way the surface stability and its modifi-cation with respect to the bulk are elucidated. The effects of surface oxidation on rearrangement and seg-regation of constituent atomic species at the surface are revealed and possible mechanisms of oxygenadsorption are discussed.

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Contributing Institute(s):

1. DOOR-User (DOOR)

Research Program(s):

1. 899 - ohne Topic (POF3-899) (POF3-899)
2. FS-Proposal: I-20090297 EC (I-20090297-EC) (I-20090297-EC)
3. ELISA - European Light Sources Activities - Synchrotrons and Free Electron Lasers (226716) (226716)

Experiment(s):

1. DORIS Beamline C (DORIS III)

Appears in the scientific report 2015

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Database coverage:
; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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