TY  - JOUR
AU  - Radisavljević, I.
AU  - Trigueiro, J.
AU  - Bundaleski, N.
AU  - Medić, M.
AU  - Romčević, N.
AU  - Teodoro, O. M. N. D.
AU  - Mitrić, M.
AU  - Ivanović, N.
TI  - XAFS and XPS Analysis of Zn<sub>0.98</sub>Fe<sub>0.02</sub>Te<sub>0.91</sub>Se<sub>0.09</sub> Semiconductor
JO  - Journal of alloys and compounds
VL  - 632
SN  - 0925-8388
CY  - Lausanne
PB  - Elsevier
M1  - PUBDB-2015-01368
SP  - 17 - 22
PY  - 2015
AB  - Local structures and electronic properties of II–VI quaternary Zn 0.98 Fe 0.02 Te 0.91 Se 0.09 mixed crystal arestudied by X-ray absorption fine structure (XAFS) while the surface composition and its oxidation inair are studied by X-ray photoelectron spectroscopy (XPS). That way the surface stability and its modifi-cation with respect to the bulk are elucidated. The effects of surface oxidation on rearrangement and seg-regation of constituent atomic species at the surface are revealed and possible mechanisms of oxygenadsorption are discussed.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000350388900003
DO  - DOI:10.1016/j.jallcom.2015.01.169
UR  - https://bib-pubdb1.desy.de/record/207480
ER  -