Journal Article

PUBDB-2015-00858

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png In-situ STM and XRD studies on Nb-H films: Coherent and incoherent phase transitions

Burlaka, V. (Corresponding Author)>Extern* ; Wagner, S.>Extern* ; Pundt, A.>Extern*

2014
Elsevier Lausanne

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Please use a persistent id in citations: doi:10.1016/j.jallcom.2014.12.103

Abstract: Hydride precipitation in 25 nm and 40 nm epitaxial Nb-films was studied by ScanningTunnelling Microscopy (STM) supported by X-Ray diffraction (XRD) measurements. Incombination, these methods yield information about the phase transition, the coherency state,the hydride precipitates' density and size as well as their lateral distribution, at 293 K. Forboth film thicknesses, hydride formation was detected with STM; it can be easily missed byXRD. While the 25 nm film showed a coherent phase transition, the phase transition wasincoherent for the 40 nm film. This is in good accordance with theory. The phase transitionfeatures are found to strongly depend on the coherency state: a large number of small hydridesappear in the coherent regime while a small number of large hydrides evolve in the incoherentregime.

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Contributing Institute(s):

1. DOOR-User (DOOR)

Research Program(s):

1. PETRA Beamline P08 (POF2-54G14) (POF2-54G14)
2. FS-Proposal: I-20120283 (I-20120283) (I-20120283)
3. FS-Proposal: I-20120501 (I-20120501) (I-20120501)
4. FS-Proposal: I-20130338 (I-20130338) (I-20130338)

Experiment(s):

1. PETRA Beamline P08 (PETRA III)

Appears in the scientific report 2014

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Database coverage:
; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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