TY  - JOUR
AU  - Burlaka, Vladimir
AU  - Wagner, Stefan
AU  - Pundt, Astrid
TI  - In-situ STM and XRD studies on Nb-H films: Coherent and incoherent phase transitions
JO  - Journal of alloys and compounds
VL  - 645
IS  - 1
SN  - 0925-8388
CY  - Lausanne
PB  - Elsevier
M1  - PUBDB-2015-00858
SP  - S388-S391
PY  - 2014
AB  - Hydride precipitation in 25 nm and 40 nm epitaxial Nb-films was studied by ScanningTunnelling Microscopy (STM) supported by X-Ray diffraction (XRD) measurements. Incombination, these methods yield information about the phase transition, the coherency state,the hydride precipitates' density and size as well as their lateral distribution, at 293 K. Forboth film thicknesses, hydride formation was detected with STM; it can be easily missed byXRD. While the 25 nm film showed a coherent phase transition, the phase transition wasincoherent for the 40 nm film. This is in good accordance with theory. The phase transitionfeatures are found to strongly depend on the coherency state: a large number of small hydridesappear in the coherent regime while a small number of large hydrides evolve in the incoherentregime.
T2  - MH 2014: Fundamentals and applications
CY  - 20 Jul 2014 - 25 Jul 2014, Manchester (England)
Y2  - 20 Jul 2014 - 25 Jul 2014
M2  - Manchester, England
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000360404100088
DO  - DOI:10.1016/j.jallcom.2014.12.103
UR  - https://bib-pubdb1.desy.de/record/206354
ER  -