Identifier | G:(DE-H253)II-20052028 |
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Contribution to a conference proceeding
Residual stress determination in surface treated alumina samples applying beam limiting masks
Advances in X-ray Analysis
8th International Conference on Residual Stresses / Denver X-ray Conference, ICRS/DXC, Denver, CODenver, CO, USA, 4 Aug 2008 - 8 Aug 2008
Advances in X-ray Analysis 52, 389-396 (2009)
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Journal Article
Residual stress determination in surface treated alumina samples applying beam limiting masks
8th International Conference on Residual Stresses / Denver X-ray Conference, ICRS/DXC, Denver, CODenver, CO, USA, 4 Aug 2008 - 8 Aug 2008
Powder diffraction 24, S77-S81 (2009) [10.1154/1.3133147]
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Poster
Approaches to the Problem of the Inverse Laplace Transform in Residual Stress Analysis by Comparison of Experimental Results of sigma(tau) and sigma(z)
8th International Conference on Residual Stresses / Denver X-ray Conference, ICRS/DXC, Denver, CODenver, CO, USA, 4 Aug 2008 - 8 Aug 2008
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All known publications ...
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