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@ARTICLE{Manns:87992,
author = {Manns, T. and Rothkirch, A. and Scholtes, B. and DESY},
title = {{R}esidual stress determination in surface treated alumina
samples applying beam limiting masks},
journal = {Powder diffraction},
volume = {24},
issn = {0885-7156},
address = {Cambridge},
publisher = {Cambridge Univ. Press},
reportid = {PHPPUBDB-10108},
pages = {S77-S81},
year = {2009},
note = {© JCPDS-ICDD; Post referee fulltext in progress; Embargo 6
months from publication},
month = {Aug},
date = {2008-08-04},
organization = {8th International Conference on
Residual Stresses / Denver X-ray
Conference, Denver, CO (USA), 4 Aug
2008 - 8 Aug 2008},
cin = {HASYLAB(-2012)},
ddc = {540},
cid = {$I:(DE-H253)HASYLAB_-2012_-20130307$},
pnm = {DORIS Beamline G3 (POF1-550) / FS-Proposal: II-20052028
(II-20052028)},
pid = {G:(DE-H253)POF1-G3-20130405 / G:(DE-H253)II-20052028},
experiment = {EXP:(DE-H253)D-G3-20150101},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000267522500017},
doi = {10.1154/1.3133147},
url = {https://bib-pubdb1.desy.de/record/87992},
}