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@INPROCEEDINGS{Manns:88111,
author = {Manns, T. and Rothkirch, A. and Scholtes, B. and Noyan,
I.C. and DESY},
title = {{R}esidual stress determination in surface treated alumina
samples applying beam limiting masks},
journal = {Advances in X-ray Analysis},
volume = {52},
address = {Newtown Square},
publisher = {International Centre for Diffraction Data ICDD},
reportid = {PHPPUBDB-10109},
pages = {389-396},
year = {2009},
comment = {Advances in X-ray Analysis},
booktitle = {Advances in X-ray Analysis},
month = {Aug},
date = {2008-08-04},
organization = {8th International Conference on
Residual Stresses / Denver X-ray
Conference, Denver, CO (USA), 4 Aug
2008 - 8 Aug 2008},
cin = {HASYLAB},
cid = {$I:(DE-H253)HASYLAB_-2012_-20130307$},
pnm = {DORIS Beamline G3 (POF1-550) / FS-Proposal: II-20052028
(II-20052028)},
pid = {G:(DE-H253)POF1-G3-20130405 / G:(DE-H253)II-20052028},
experiment = {EXP:(DE-H253)D-G3-20150101},
typ = {PUB:(DE-HGF)8},
url = {https://bib-pubdb1.desy.de/record/88111},
}