%0 Conference Paper
%A Manns, T.
%A Rothkirch, A.
%A Scholtes, B.
%A Noyan, I.C.
%A DESY
%T Residual stress determination in surface treated alumina samples applying beam limiting masks
%J Advances in X-ray Analysis
%V 52
%C Newtown Square
%I International Centre for Diffraction Data ICDD
%M PHPPUBDB-10109
%P 389-396
%D 2009
%< Advances in X-ray Analysis
%B 8th International Conference on Residual Stresses / Denver X-ray Conference
%C 4 Aug 2008 - 8 Aug 2008, Denver, CO (USA)
Y2 4 Aug 2008 - 8 Aug 2008
M2 Denver, CO, USA
%F PUB:(DE-HGF)8
%9 Contribution to a conference proceeding
%U https://bib-pubdb1.desy.de/record/88111