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| Internal Report | DESY-2014-01350 |
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Report No.: TUP110
Abstract: The aim of this project is to develop a system for defect detection by means of X-ray fluorescence (XRF) analysis. XRF is a high sensitivity spectroscopy technique allowing the detection of trace element content, such as the few microgram impurities, responsible for low cavity performances if embedded in the equatorial region during cavity manufacturing. The proposed setup is customized on 1.3 GHz TESLA-type niobium cavities: both the detector and the X-ray excitation source are miniaturized so to allow the probe to enter within the 70 mm iris diameter and aside of the HOM couplers. The detection-excitation geometry is focused on cavity cell equator surface located at about 103 mm from the cavity axis, with an intrinsic spot-size of about 10 mm. The measuring head will be settled on a high angular resolution optical inspection system at DESY, exploiting the experience of OBACHT. Defect position is obtained by means of angular inner surface scanning. Quantitative determination of defect content can be carried out by means of the so called fundamental parameters technique with a Niobium standard calibration.
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