Internal Reports

The report documents dose rate calculations with FLUKA as a result of 14 GeV electron beamlosses within the UG4 level dump pit at XS1. Locations of interest include the UG4 dumppit itself (dump window activation) to the UG3 level above it (sensitive electronics) and to theUG2 level (neutron field characterization). [...]

This article summarizes the possibilities and the application of the high energy X-ray diffraction methods to study the short range structures in the glass and nano-structured ceramic materials based on the recent developments and the instrumental facilities. The difficulties and the inapplicability of the conventional X-ray diffraction techniques to get structuralinformation about the glass and nano-structured materials over the past few decades has been resolved with the development of advanced X-ray based techniques both inhouse and synchrotrons. [...]