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Journal Article | DESY-2013-00824 |
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2013
American Institute of Physics
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Please use a persistent id in citations: doi:10.1063/1.4821146 doi:10.3204/DESY-2013-00824
Abstract: We present a Michelson interferometer for 13.5 nm soft x-ray radiation. It is characterized in a proof of-principle experiment using synchrotron radiation, where the temporal coherence is measured to be 13 fs. The curvature of the thin-film beam splitter membrane is derived from the observed fringe pattern. The applicability of this Michelson interferometer at intense free-electron lasers is investigated,particularly with respect to radiation damage. This study highlights the potential role of such Michelson interferometers in solid density plasma investigations using, for instance, extreme soft x-ray free electron lasers. A setup using the Michelson interferometer for pseudo-Nomarski-interferometry is proposed.
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