| Home > Publications database > Low-temperature powder X-ray diffraction measurements in vacuum: analysis of the thermal displacement of copper |
| Journal Article | PUBDB-2016-04394 |
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2016
Munksgaard
Copenhagen
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Please use a persistent id in citations: doi:10.1107/S1600576715022621
Abstract: A serious limitation of the all-in-vacuum diffractometer reported by Straasø, Dippel, Becker & Als-Nielsen [J. Synchrotron Rad. (2014), 21, 119-126] has so far been the inability to cool samples to near-cryogenic temperatures during measurement. The problem is solved by placing the sample in a jet of helium gas cooled by liquid nitrogen. The resulting temperature change is quantified by determining the change in unit-cell parameter and atomic displacement parameter of copper. The cooling proved successful, with a resulting temperature of ~95 (3) K. The measured powder X-ray diffraction data are of superb quality and high resolution [up to sin$\theta/\lambda$ = 2.2 Å$^{-1}$], permitting an extensive modelling of the thermal displacement. The anharmonic displacement of copper was modelled by a Gram-Charlier expansion of the temperature factor. As expected, the corresponding probability distribution function shows an increased probability away from neighbouring atoms and a decreased probability towards them.
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