Journal Article

PHPPUBDB-17451

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Effect of biasing at elevated temperature on the electronic structure of $Pt/HfO_{2}/Si$ stacks

Matveyev, Y. ; Zenkevich, A. ; Lebedinskii, Y. ; Thiess, S. ; Drube, W. ; DESY

2011
Elsevier [S.l.] @

This record in other databases:      

Please use a persistent id in citations: doi:10.1016/j.mee.2011.03.104

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Contributing Institute(s):

1. Experiments with synchrotron radiation (HASYLAB)

Research Program(s):

1. PETRA Beamline P09 (POF2-54G14) (POF2-54G14)
2. FS-Proposal: I-20100402 (I-20100402) (I-20100402)

Experiment(s):

1. PETRA Beamline P09 (PETRA III)

Appears in the scientific report 2011

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Database coverage:
; JCR ; No Author Disambiguation ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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