Talk (non-conference)

PHPPUBDB-10679

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png X-ray reflectometric investigation of surface roughnes of SiC substrate wafers and its influence on the structural perfection of the deposited SiC epitaxial layers

Mazur, K. ; Wierzchowski, W. ; Wieteska, K. ; Hofman, W. ; Kosciewicz, K. ; Strupinski, W. ; Geaeff, W. ; DESY

2009

---

Contributing Institute(s):

1. Experiments with synchrotron radiation (HASYLAB)

Research Program(s):

1. DORIS Beamline E2 (POF1-550) (POF1-550)
2. DORIS Beamline F1 (POF1-550) (POF1-550)
3. FS-Proposal: II-20060165 EC (II-20060165-EC) (II-20060165-EC)

Experiment(s):

1. DORIS Beamline E2 (DORIS III)
2. DORIS Beamline F1 (DORIS III)

Appears in the scientific report 2009

---

Database coverage:
No Author Disambiguation

---