Journal Article

PUBDB-2026-01160

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Speckle analysis as a characterization tool for the focusing properties of diamond X-ray lenses

Youssef, M. ; Zozulya, A. V.XFEL.EU* ; Lyubomirskiy, M. ; Ansaldi, G.XFEL.EU* ; Hallmann, J.XFEL.EU* ; Jo, W. ; Moeller, J.XFEL.EU* ; Pudell, J.-E.XFEL.EU* ; Makita, M. ; Seiboth, F.XFEL.EU*DESY* ; Wang, W. ; Schroer, C. G.XFEL.EU*DESY* ; Madsen, A.

2025
IOP Publ. Bristol

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Please use a persistent id in citations: doi:10.1088/1742-6596/3010/1/012104

Abstract: The availability of intense X-ray beams at megahertz repetition rate allows for new scattering and imaging experiments using the unique pulse train structure of the European X-ray Free-Electron Laser (EuXFEL). However, the resulting heat load can pose challenges for X-ray optics and potentially limit the efficiency. In this context, X-ray optics made of diamond emerge as a promising solution better suited for the extreme beam conditions at EuXFEL. In this article, we demonstrate a simple speckle analysis to determine the size of the focused beam in a caustic scan. The lenses are 1D planar diamond lenses and experiments were performed at the Materials Imaging and Dynamics (MID) station of EuXFEL. We find a minimum beam size of 630 nm and compare the speckle method with the more conventional method of wire scanning.

Note: cc-by

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Contributing Institute(s):

1. FS-PETRA (FS-PETRA)
2. MID (XFEL_E1_MID)
3. OPTICS (HH_FS_P_OPT)

Research Program(s):

1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)

Experiment(s):

1. No specific instrument

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Database coverage:
; Nationallizenz

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