| Home > Publications database > FIB-SEM based slicing tomography of defective tooth enamel |
| Bachelor Thesis | PUBDB-2025-04407 |
; ;
2023
Universität Hamburg
Hamburg
Abstract: For the examination of human tooth enamel, the FIB-SEM (Focused Ion Beam -Scanning Electron Microscop) is used. Layers of the tooth are removed. The cross sec-tions can then be imaged with an electron microscope. This means three-dimensionalmodels can be created using multiple layers. Teeth a↵ected by MIH (molar incisorhypomineralization) are examined to determine di↵erences from healthy teeth. TheFIB-SEM method is then compared with X-ray tomography.
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