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@MASTERSTHESIS{Nourmofidi:639306,
      author       = {Nourmofidi, Omidreza},
      othercontributors = {Stierle, Andreas and Keller, Thomas F.},
      title        = {{FIB}-{SEM} based slicing tomography of defective tooth
                      enamel},
      school       = {University of Hamburg},
      type         = {Bachelorarbeit},
      address      = {Hamburg},
      publisher    = {Universität Hamburg},
      reportid     = {PUBDB-2025-04407},
      pages        = {30},
      year         = {2023},
      note         = {Bachelorarbeit, University of Hamburg, 2023},
      abstract     = {For the examination of human tooth enamel, the FIB-SEM
                      (Focused Ion Beam -Scanning Electron Microscop) is used.
                      Layers of the tooth are removed. The cross sec-tions can
                      then be imaged with an electron microscope. This means
                      three-dimensionalmodels can be created using multiple
                      layers. Teeth a↵ected by MIH (molar
                      incisorhypomineralization) are examined to determine
                      di↵erences from healthy teeth. TheFIB-SEM method is then
                      compared with X-ray tomography.},
      cin          = {FS-NL},
      cid          = {I:(DE-H253)FS-NL-20120731},
      pnm          = {632 - Materials – Quantum, Complex and Functional
                      Materials (POF4-632)},
      pid          = {G:(DE-HGF)POF4-632},
      experiment   = {EXP:(DE-H253)Nanolab-04-20150101},
      typ          = {PUB:(DE-HGF)2},
      url          = {https://bib-pubdb1.desy.de/record/639306},
}