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000639306 037__ $$aPUBDB-2025-04407
000639306 041__ $$aEnglish
000639306 1001_ $$0P:(DE-H253)PIP1105642$$aNourmofidi, Omidreza$$b0$$eCorresponding author$$gmale
000639306 245__ $$aFIB-SEM based slicing tomography of defective tooth enamel$$f2023-06-20 - 2023-09-21
000639306 260__ $$aHamburg$$bUniversität Hamburg$$c2023
000639306 300__ $$a30
000639306 3367_ $$2DRIVER$$abachelorThesis
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000639306 3367_ $$0PUB:(DE-HGF)2$$2PUB:(DE-HGF)$$aBachelor Thesis$$bbachelor$$mbachelor$$s1762166532_1739756
000639306 3367_ $$2BibTeX$$aMASTERSTHESIS
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000639306 502__ $$aBachelorarbeit, University of Hamburg, 2023$$bBachelorarbeit$$cUniversity of Hamburg$$d2023$$o2023
000639306 520__ $$aFor the examination of human tooth enamel, the FIB-SEM (Focused Ion Beam -Scanning Electron Microscop) is used. Layers of the tooth are removed. The cross sec-tions can then be imaged with an electron microscope. This means three-dimensionalmodels can be created using multiple layers. Teeth a↵ected by MIH (molar incisorhypomineralization) are examined to determine di↵erences from healthy teeth. TheFIB-SEM method is then compared with X-ray tomography.
000639306 536__ $$0G:(DE-HGF)POF4-632$$a632 - Materials – Quantum, Complex and Functional Materials (POF4-632)$$cPOF4-632$$fPOF IV$$x0
000639306 693__ $$0EXP:(DE-H253)Nanolab-04-20150101$$1EXP:(DE-H253)DESY-NanoLab-20150101$$5EXP:(DE-H253)Nanolab-04-20150101$$aNanolab$$eDESY NanoLab: Microscopy$$x0
000639306 7001_ $$0P:(DE-H253)PIP1012873$$aStierle, Andreas$$b1$$eThesis advisor
000639306 7001_ $$0P:(DE-H253)PIP1019138$$aKeller, Thomas F.$$b2$$eThesis advisor
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000639306 9101_ $$0I:(DE-588b)2008985-5$$6P:(DE-H253)PIP1019138$$aDeutsches Elektronen-Synchrotron$$b2$$kDESY
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