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Untersuchungen von Strahlenschäden an Feldeffekttransistoren und an CMOS-Speicherbausteinen



1991

122 pp. () [10.3204/PUBDB-2023-04381]  GO

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Report No.: DESY-F35-91-02

Keyword(s): thesis ; calorimeter: readout ; signal processing ; integrated circuit ; semiconductor ; radiation: damage ; electronics ; ZEUS ; DESY DESY HERA Stor Stor


Note: Hamburg DESY - Internal Rep. F35-91-02 (91/04,rec.Jun.) 110 p

Contributing Institute(s):
  1. DESY Retrocat (DESY(-2012))
Research Program(s):
  1. 899 - ohne Topic (POF4-899) (POF4-899)
Experiment(s):
  1. No specific instrument

Database coverage:
OpenAccess
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Private Collections > >DESY > DESY(-2012)
Document types > Reports > Reports
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OpenAccess

 Record created 2023-07-23, last modified 2023-07-24


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