Contribution to a conference proceedings

PUBDB-2017-00929

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png RF Analysis Of Electropolishing For EXFEL Cavities Production At Ettore Zanon SPA

Sulimov, A. (Corresponding author)DESY* ; Gresele, A. ; Giaretta, M. ; Visentin, A.

2016
JACoW Geneva

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Please use a persistent id in citations: doi:10.3204/PUBDB-2017-00929

Abstract: After successful finishing of superconducting cavities mass production at Ettore Zanon S.p.A. (EZ) for the European XFEL (EXFEL), the authors had the possibility to provide a detailed analysis of the electropolishing (EP) process. The analysis of EP material removal is based on specified RF measurements and was used for the determination of both, the ratio between cavity’s iris and equator and uniformity in different cells. A comparison of the RF measurements results with mechanical measurements is presented.

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Contributing Institute(s):

1. HF-Technik Supraleitung (MHF-sl)

Research Program(s):

1. 631 - Accelerator R & D (POF3-631) (POF3-631)

Experiment(s):

1. Facility (machine) XFEL

Appears in the scientific report 2016

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Database coverage:

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