TY  - CONF
AU  - Sulimov, Alexey
AU  - Gresele, A.
AU  - Giaretta, M.
AU  - Visentin, A.
TI  - RF Analysis Of Electropolishing For EXFEL Cavities Production At Ettore Zanon SPA
CY  - Geneva
PB  - JACoW
M1  - PUBDB-2017-00929
SP  - 3
PY  - 2016
AB  - After successful finishing of superconducting cavities mass production at Ettore Zanon S.p.A. (EZ) for the European XFEL (EXFEL), the authors had the possibility to provide a detailed analysis of the electropolishing (EP) process. The analysis of EP material removal is based on specified RF measurements and was used for the determination of both, the ratio between cavity’s iris and equator and uniformity in different cells. A comparison of the RF measurements results with mechanical measurements is presented.
T2  - 28th Linear Accelerator Conference
CY  - 25 Sep 2016 - 30 Sep 2016, East Lansing, MI (USA)
Y2  - 25 Sep 2016 - 30 Sep 2016
M2  - East Lansing, MI, USA
LB  - PUB:(DE-HGF)8
DO  - DOI:10.3204/PUBDB-2017-00929
UR  - https://bib-pubdb1.desy.de/record/317844
ER  -