Journal Article PUBDB-2017-00374

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Characterization of AGIPD1.0: The full scale chip

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2016
North-Holland Publ. Co. Amsterdam

Nuclear instruments & methods in physics research / A 838, 39 - 46 () [10.1016/j.nima.2016.09.007]
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Abstract: The AGIPD (adaptive gain integrating pixel detector) detector is a high frame rate (4.5 MHz) and high dynamic range (up to 104 ·12.4 keV photons) detector with single photon resolution (down to 4 keV taking 5σ as limit and lowest noise settings) developed for the European XFEL (XFEL.EU). This work is focused on the characterization of AGIPD1.0, which is the first full scale version of the chip. The chip is 64×64 pixels and each pixel has a size of 200×200 μm2. Each pixel can store up to 352 images at a rate of 4.5 MHz (corresponding to 220 ns). A detailed characterization of the AGIPD1.0 chip has been performed in order to assess the main performance of the ASIC in terms of gain, noise, speed and dynamic range. From the measurements presented in this paper a good uniformity of the gain, a noise around 320 e− (rms) in standard mode and around 240 e− (rms) in high gain mode has been measured. Furthermore a detailed discussion about the non-linear behavior after the gain switching is presented with both experimental results and simulations.

Classification:

Contributing Institute(s):
  1. FS-DS (CFEL-DRD)
Research Program(s):
  1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)
  2. PSI-FELLOW - International Fellowship Program on Materials & Matter, Energy & Environment, Human Health & Life-Sciences, and Accelerator Technology (290605) (290605)
Experiment(s):
  1. Experiments at XFEL

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 Record created 2017-01-10, last modified 2026-02-12


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