Home > Publications database > Micron-Scale Vertical Beam Size Measurements Based on Transition Radiation Imaging With a Schwarzschild Objective |
Poster | PUBDB-2015-04613 |
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2015
Abstract: This report presents preliminary results of a measurement of a micron–scale vertical beam size based on imaging of optical transition radiation in the visible region. The visualization of point spread function dominated beam images was carried out using a Schwarzschild objective that provides high magnification and that is free of some of aberrations. According to the preliminary data treatment, a vertical rms beam size of 1.37 +- 0.07 micrometer was measured at the 855MeV beam of the Mainz Microtron MAMI (Germany).
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