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Micron-Scale Vertical Beam Size Measurements Based on Transition Radiation Imaging With a Schwarzschild Objective

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2015

International Beam Instrumentation Conference 2015, IBIC 2015, MelbourneMelbourne, Australia, 13 Sep 2015 - 17 Sep 20152015-09-132015-09-17  GO

Abstract: This report presents preliminary results of a measurement of a micron–scale vertical beam size based on imaging of optical transition radiation in the visible region. The visualization of point spread function dominated beam images was carried out using a Schwarzschild objective that provides high magnification and that is free of some of aberrations. According to the preliminary data treatment, a vertical rms beam size of 1.37 +- 0.07 micrometer was measured at the 855MeV beam of the Mainz Microtron MAMI (Germany).


Contributing Institute(s):
  1. Diagnose und Instrumentierung (MDI)
  2. FS-Arbeitsgruppe (FS-ML)
Research Program(s):
  1. 631 - Accelerator R & D (POF3-631) (POF3-631)
Experiment(s):
  1. Measurement at external facility

Appears in the scientific report 2015
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Private Collections > >DESY > >M > >MDI > MDI
Private Collections > >DESY > >FS > FS-ML
Document types > Presentations > Poster
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 Record created 2015-11-08, last modified 2021-11-10


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