%0 Conference Paper
%A Kube, Gero
%A Bajt, Sasa
%A Artyukov, I. A.
%A Lauth, W.
%A Potylitsyn, A.
%A Sukhikh, Leonid
%A Vukolov, A. V.
%T Micron-Scale Vertical Beam Size Measurements Based on Transition Radiation Imaging With a Schwarzschild Objective
%M PUBDB-2015-04613
%D 2015
%X This report presents preliminary results of a measurement of a micron–scale vertical beam size based on imaging of optical transition radiation in the visible region. The visualization of point spread function dominated beam images was carried out using a Schwarzschild objective that provides high magnification and that is free of some of aberrations. According to the preliminary data treatment, a vertical rms beam size of 1.37 +- 0.07 micrometer was measured at the 855MeV beam of the Mainz Microtron MAMI (Germany).
%B International Beam Instrumentation Conference 2015
%C 13 Sep 2015 - 17 Sep 2015, Melbourne (Australia)
Y2 13 Sep 2015 - 17 Sep 2015
M2 Melbourne, Australia
%F PUB:(DE-HGF)24
%9 Poster
%U https://bib-pubdb1.desy.de/record/276402