Home > Publications database > X-ray absorption spectroscopy of Cu-doped $WO_{3}$ films for use inelectrochemical metallization cell memory |
Journal Article | DESY-2014-03203 |
; ; ; ;
2014
Elsevier Science
Amsterdam [u.a.]
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Please use a persistent id in citations: doi:10.1016/j.jnoncrysol.2014.01.022
Abstract: We have performed the first synchrotron radiation X-ray absorption spectroscopy (EXAFS/XANES) study of the local atomic and electronic structure around Cu and W ions in WO3/Cu/WO3/Si and WO3/Cu/Si multilayered structures, aimed for the application in the electrochemical metallization cell memory. The influence of low-temperature annealing at 135 °C has been investigated in details, and a structural model of Cu-doped WO3 films is proposed
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