Journal Article DESY-2014-03203

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X-ray absorption spectroscopy of Cu-doped $WO_{3}$ films for use inelectrochemical metallization cell memory

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2014
Elsevier Science Amsterdam [u.a.]

Journal of non-crystalline solids 401, 87 - 91 () [10.1016/j.jnoncrysol.2014.01.022]
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Abstract: We have performed the first synchrotron radiation X-ray absorption spectroscopy (EXAFS/XANES) study of the local atomic and electronic structure around Cu and W ions in WO3/Cu/WO3/Si and WO3/Cu/Si multilayered structures, aimed for the application in the electrochemical metallization cell memory. The influence of low-temperature annealing at 135 °C has been investigated in details, and a structural model of Cu-doped WO3 films is proposed

Classification:

Contributing Institute(s):
  1. DOOR-User (DOOR)
  2. FS-Experimentebetreuung DORIS (FS-DO)
Research Program(s):
  1. DORIS Beamline C (POF2-54G13) (POF2-54G13)
  2. FS-Proposal: I-20110667 EC (I-20110667-EC) (I-20110667-EC)
  3. ELISA - European Light Sources Activities - Synchrotrons and Free Electron Lasers (226716) (226716)
Experiment(s):
  1. DORIS Beamline C (DORIS III)

Appears in the scientific report 2014
Database coverage:
Medline ; Current Contents - Social and Behavioral Sciences ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection
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 Record created 2014-08-27, last modified 2025-07-30


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