| Home > Publications database > The Population of Twin Related Boundaries in High Purity Nickel as measured with near‐field High Energy X‐ray Diffraction Microscopy |
| Contribution to a conference proceedings/Contribution to a book | PUBDB-2017-06005 |
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2014
ISBN: 978-1-63439-642-4
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Please use a persistent id in citations: doi:10.1002/9781119016854.ch70 doi:10.3204/PUBDB-2017-06005
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