000643590 001__ 643590
000643590 005__ 20260209140534.0
000643590 0247_ $$2doi$$a10.1103/xxx9-8tk2
000643590 0247_ $$2ISSN$$a2469-9950
000643590 0247_ $$2ISSN$$a2469-9977
000643590 0247_ $$2ISSN$$a0163-1829
000643590 0247_ $$2ISSN$$a0556-2805
000643590 0247_ $$2ISSN$$a1095-3795
000643590 0247_ $$2ISSN$$a1098-0121
000643590 0247_ $$2ISSN$$a1538-4489
000643590 0247_ $$2ISSN$$a1550-235X
000643590 0247_ $$2ISSN$$a2469-9969
000643590 0247_ $$2datacite_doi$$a10.3204/PUBDB-2026-00301
000643590 0247_ $$2openalex$$aopenalex:W4417182816
000643590 037__ $$aPUBDB-2026-00301
000643590 041__ $$aEnglish
000643590 082__ $$a530
000643590 1001_ $$00009-0005-1301-0018$$aSchumi-Mareček, David$$b0
000643590 245__ $$aHigh-speed x-ray reflectometry for characterization of thin film growth at high deposition rates
000643590 260__ $$aWoodbury, NY$$bInst.$$c2025
000643590 3367_ $$2DRIVER$$aarticle
000643590 3367_ $$2DataCite$$aOutput Types/Journal article
000643590 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1769776634_2454235
000643590 3367_ $$2BibTeX$$aARTICLE
000643590 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000643590 3367_ $$00$$2EndNote$$aJournal Article
000643590 500__ $$acc-by
000643590 520__ $$aWe present a high-throughput, real-time study of PTCDI-C8thin film growth using quick x-ray reflectivity (qXRR) with 12 ms time resolution, combined with machine learning-based analysis. In situ qXRR enables monitoring of vacuum deposition at growth rates from 1 to 30Å/s, accessing a previously unexplored regime in molecular beam deposition. To efficiently analyze the resulting ∼20000reflectivity curves, we employ a convolutional neural network trained on a physics-informed multilayer model. This approach robustly extracts key structural parameters—including thickness, roughness, and crystalline versus amorphous content—from noisy data. We quantify interface roughness as a function of both film thickness and growth rate, identifying rapid roughening with a scaling exponent of 
000643590 536__ $$0G:(DE-HGF)POF4-631$$a631 - Matter – Dynamics, Mechanisms and Control (POF4-631)$$cPOF4-631$$fPOF IV$$x0
000643590 536__ $$0G:(DE-HGF)POF4-6G3$$a6G3 - PETRA III (DESY) (POF4-6G3)$$cPOF4-6G3$$fPOF IV$$x1
000643590 588__ $$aDataset connected to CrossRef, Journals: bib-pubdb1.desy.de
000643590 693__ $$0EXP:(DE-H253)P-P08-20150101$$1EXP:(DE-H253)PETRAIII-20150101$$6EXP:(DE-H253)P-P08-20150101$$aPETRA III$$fPETRA Beamline P08$$x0
000643590 7001_ $$00000-0002-4548-3558$$aNelson, Andrew$$b1
000643590 7001_ $$0P:(DE-H253)PIP1107215$$aPfeiler, Erwin$$b2
000643590 7001_ $$0P:(DE-H253)PIP1107214$$aEder, Maximilian$$b3
000643590 7001_ $$0P:(DE-H253)PIP1007852$$aBertram, Florian$$b4
000643590 7001_ $$0P:(DE-H253)PIP1012003$$aKowarik, Stefan$$b5$$eCorresponding author
000643590 773__ $$0PERI:(DE-600)2844160-6$$a10.1103/xxx9-8tk2$$gVol. 112, no. 23, p. 235304$$n23$$p235304$$tPhysical review / B$$v112$$x2469-9950$$y2025
000643590 8564_ $$uhttps://bib-pubdb1.desy.de/record/643590/files/xxx9-8tk2.pdf$$yOpenAccess
000643590 8564_ $$uhttps://bib-pubdb1.desy.de/record/643590/files/xxx9-8tk2.pdf?subformat=pdfa$$xpdfa$$yOpenAccess
000643590 909CO $$ooai:bib-pubdb1.desy.de:643590$$pdnbdelivery$$pdriver$$pVDB$$popen_access$$popenaire
000643590 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1107215$$aExternal Institute$$b2$$kExtern
000643590 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1107214$$aExternal Institute$$b3$$kExtern
000643590 9101_ $$0I:(DE-588b)2008985-5$$6P:(DE-H253)PIP1007852$$aDeutsches Elektronen-Synchrotron$$b4$$kDESY
000643590 9101_ $$0I:(DE-HGF)0$$6P:(DE-H253)PIP1012003$$aExternal Institute$$b5$$kExtern
000643590 9131_ $$0G:(DE-HGF)POF4-631$$1G:(DE-HGF)POF4-630$$2G:(DE-HGF)POF4-600$$3G:(DE-HGF)POF4$$4G:(DE-HGF)POF$$aDE-HGF$$bForschungsbereich Materie$$lVon Materie zu Materialien und Leben$$vMatter – Dynamics, Mechanisms and Control$$x0
000643590 9131_ $$0G:(DE-HGF)POF4-6G3$$1G:(DE-HGF)POF4-6G0$$2G:(DE-HGF)POF4-600$$3G:(DE-HGF)POF4$$4G:(DE-HGF)POF$$aDE-HGF$$bForschungsbereich Materie$$lGroßgeräte: Materie$$vPETRA III (DESY)$$x1
000643590 9141_ $$y2025
000643590 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS$$d2024-12-10
000643590 915__ $$0StatID:(DE-HGF)0160$$2StatID$$aDBCoverage$$bEssential Science Indicators$$d2024-12-10
000643590 915__ $$0StatID:(DE-HGF)1230$$2StatID$$aDBCoverage$$bCurrent Contents - Electronics and Telecommunications Collection$$d2024-12-10
000643590 915__ $$0LIC:(DE-HGF)CCBY4$$2HGFVOC$$aCreative Commons Attribution CC BY 4.0
000643590 915__ $$0StatID:(DE-HGF)0600$$2StatID$$aDBCoverage$$bEbsco Academic Search$$d2024-12-10
000643590 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences$$d2024-12-10
000643590 915__ $$0StatID:(DE-HGF)0113$$2StatID$$aWoS$$bScience Citation Index Expanded$$d2024-12-10
000643590 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection$$d2024-12-10
000643590 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5$$d2024-12-10
000643590 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000643590 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bASC$$d2024-12-10
000643590 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bPHYS REV B : 2022$$d2024-12-10
000643590 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline$$d2024-12-10
000643590 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bClarivate Analytics Master Journal List$$d2024-12-10
000643590 9201_ $$0I:(DE-H253)HAS-User-20120731$$kDOOR ; HAS-User$$lDOOR-User$$x0
000643590 9201_ $$0I:(DE-H253)FS-PETRA-D-20210408$$kFS-PETRA-D$$lPETRA-D$$x1
000643590 980__ $$ajournal
000643590 980__ $$aVDB
000643590 980__ $$aUNRESTRICTED
000643590 980__ $$aI:(DE-H253)HAS-User-20120731
000643590 980__ $$aI:(DE-H253)FS-PETRA-D-20210408
000643590 9801_ $$aFullTexts