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@INPROCEEDINGS{Barp:632223,
author = {Barp, Jackson L. and Patjens, Svenja and Falkenberg, Gero
and Fevola, Giovanni and Garrevoet, Jan and Stückelberger,
Michael},
title = {{M}ulti-{M}odal {S}canning {L}aser {M}icroscope for
{D}iffraction-{L}imited {S}olar-{C}ell {I}maging},
reportid = {PUBDB-2025-02151},
year = {2024},
abstract = {The advancement of new technologies such as solar cells
relies on the development of measurement techniques that
allow us to characterize and understand fundamental
parameters and processes within the devices of interest.
Laboratory laser-based microscopy has proven to be an easy
and successful way to characterize many solar cell
parameters. However, due to the decreasing size of the
structures in next-generation solar cells, synchrotron-based
X-ray microscopy is becoming increasingly important to
unveil solar cell limitations in the sub-micrometer scale.
We have developed a multi-modal scanning laser microscope,
which allows us to access fundamental optical and electrical
parameters of a wide range of materials, via temporally
resolved and spectrally resolved photoluminescence (TR-PL
and SR-PL), laser beam induced current or voltage
(LBIC/LBIV), and impedance spectroscopy (IS). Moreover, the
microscope is built in analogy to a synchrotron beamline,
serving as a test bed for the development of sophisticated
synchrotron-based techniques. In this talk we give technical
details about the developed setup, the different scanning
modalities, the controlling protocols and the data analysis
algorithms. We showcase the variability and compatibility of
the microscope with different solar cell architectures,
types, and sizes by means of the optical charge-carrier
lifetime and PL intensity (via TR-PL), the bandgap
wavelength (via SR-PL), the electrical performance (via
laser reflection and LBIC) and the electrical charge-carrier
lifetime (via time-resolved LBIV and IS). Furthermore, we
elaborate on how the knowledge gained can be directly
translated to synchrotron-based experiments, saving precious
and expensive beamtime.},
month = {Jun},
date = {2024-06-09},
organization = {2024 IEEE 52nd Photovoltaic Specialist
Conference, Seattle (USA), 9 Jun 2024 -
14 Jun 2024},
cin = {FS-PETRA},
cid = {I:(DE-H253)FS-PETRA-20140814},
pnm = {632 - Materials – Quantum, Complex and Functional
Materials (POF4-632)},
pid = {G:(DE-HGF)POF4-632},
experiment = {EXP:(DE-MLZ)NOSPEC-20140101},
typ = {PUB:(DE-HGF)1},
doi = {10.1109/PVSC57443.2024.10749246},
url = {https://bib-pubdb1.desy.de/record/632223},
}