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| Abstract | PUBDB-2025-02151 |
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2024
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Please use a persistent id in citations: doi:10.1109/PVSC57443.2024.10749246
Abstract: The advancement of new technologies such as solar cells relies on the development of measurement techniques that allow us to characterize and understand fundamental parameters and processes within the devices of interest. Laboratory laser-based microscopy has proven to be an easy and successful way to characterize many solar cell parameters. However, due to the decreasing size of the structures in next-generation solar cells, synchrotron-based X-ray microscopy is becoming increasingly important to unveil solar cell limitations in the sub-micrometer scale. We have developed a multi-modal scanning laser microscope, which allows us to access fundamental optical and electrical parameters of a wide range of materials, via temporally resolved and spectrally resolved photoluminescence (TR-PL and SR-PL), laser beam induced current or voltage (LBIC/LBIV), and impedance spectroscopy (IS). Moreover, the microscope is built in analogy to a synchrotron beamline, serving as a test bed for the development of sophisticated synchrotron-based techniques. In this talk we give technical details about the developed setup, the different scanning modalities, the controlling protocols and the data analysis algorithms. We showcase the variability and compatibility of the microscope with different solar cell architectures, types, and sizes by means of the optical charge-carrier lifetime and PL intensity (via TR-PL), the bandgap wavelength (via SR-PL), the electrical performance (via laser reflection and LBIC) and the electrical charge-carrier lifetime (via time-resolved LBIV and IS). Furthermore, we elaborate on how the knowledge gained can be directly translated to synchrotron-based experiments, saving precious and expensive beamtime.
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