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000629861 1001_ $$0P:(DE-H253)PIP1101652$$aPokhriyal, Preeti$$b0$$eCorresponding author
000629861 1112_ $$a15th International Conference on Synchrotron Radiation Instrumentation$$cHamburg$$d2024-08-26 - 2024-08-30$$gSRI 2024$$wGermany
000629861 245__ $$aSample cell for in-situ measurements of ferroelectric polarization and diffraction at beamline P24, DESY
000629861 260__ $$aBristol$$bIOP Publ.$$c2025
000629861 300__ $$a7
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000629861 500__ $$a2025 J. Phys.: Conf. Ser. 3030
000629861 520__ $$aIn-situ measurements of ferroelectric polarization and diffraction under an applied electric field are critical for establishing accurate structure-property correlation. This method captures the dynamic response of ferroelectric materials. To address the challenge of measuring ferroelectric polarization and diffraction data, an in-situ cell equipped with the necessary electronics is developed at the P24 chemical crystallography beamline. Designed sample cell is suitable for measuring ferroelectric polarization and synchrotron X-ray diffraction under an applied electric field for plate shaped crystals. To have temperature control, cartridge heater, peltier element and heat sink are installed and one can perform the experiments in the temperature range of 240K to 420K. The sample cell has been tested with single crystals of KTa0.67Nb0.33NO3(KTN), K0.95Li0.05Ta0.73Nb0.27NO3(Li doped KTN) and BaTiO3(BTO).
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000629861 7001_ $$0P:(DE-HGF)0$$aRitter, Heiko-Schulz$$b1
000629861 7001_ $$0P:(DE-H253)PIP1007498$$aTolkiehn, Martin$$b2
000629861 773__ $$0PERI:(DE-600)2166409-2$$a10.1088/1742-6596/3010/1/012154$$gVol. 3010, no. 1, p. 012154 -$$p012154$$tJournal of physics / Conference Series$$v3010$$x1742-6588$$y2025
000629861 7870_ $$0PUBDB-2024-01368$$aLaasch, Wiebke et.al.$$dBristol, UK : IOP Publishing Ltd, 2025$$iHasPart$$r$$tProceedings SRI 2024
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