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@ARTICLE{Sjoe:627884,
      author       = {Sjoe, Hanna and Shabalin, Anatoly and Lienert, Ulrich and
                      Hektor, Johan and Schaefer, Andreas and Carlsson, Per-Anders
                      and Alwmark, Carl and Gustafson, Johan},
      title        = {{S}urface grain orientation mapping using grazing incidence
                      {X}-ray diffraction},
      journal      = {Surface science},
      volume       = {754},
      issn         = {0039-6028},
      address      = {Amsterdam},
      publisher    = {Elsevier},
      reportid     = {PUBDB-2025-01659},
      pages        = {122693},
      year         = {2025},
      abstract     = {Tomographic surface X-ray diffraction (TSXRD) is an
                      adaptation of classic surface X-ray diffraction to allow for
                      measurements of polycrystalline surfaces. Compared to most
                      other surface-sensitive techniques, surface X-ray
                      diffraction has advantages in operando studies, since it can
                      provide crystallographic information about surface
                      structures in high gas pressures (above atmospheric) as well
                      as through liquids. The method has, however, so far been
                      limited to ideal samples, such as single crystals, since the
                      long beam footprint illuminates several grains, which, with
                      conventional SXRD, prevents an assignment of the diffraction
                      signal and thus the structural information, to a certain
                      grain. Here, we present the first step in the development of
                      TSXRD, in which the grain shapes and orientations on a
                      polycrystalline surface can be mapped using grazing
                      incidence X-ray diffraction. The resulting knowledge about
                      the shape, position, and orientation of the grains at the
                      surface will be the steppingstone for further SXRD analysis
                      of polycrystalline surfaces, allowing us to identify which
                      diffraction signals belong to which grain. This method is
                      thus part of opening up SXRD as a method for operando
                      studies of more industry-relevant samples. Our grain maps
                      are compared to those obtained with electron back-scatter
                      diffraction measurements of the same sample, confirming the
                      validity of the method.},
      cin          = {FS DOOR-User / FS-PET-D},
      ddc          = {530},
      cid          = {$I:(DE-H253)FS_DOOR-User-20241023$ /
                      I:(DE-H253)FS-PET-D-20190712},
      pnm          = {632 - Materials – Quantum, Complex and Functional
                      Materials (POF4-632) / 6G3 - PETRA III (DESY) (POF4-6G3) /
                      SWEDEN-DESY - SWEDEN-DESY Collaboration
                      $(2020_Join2-SWEDEN-DESY)$},
      pid          = {G:(DE-HGF)POF4-632 / G:(DE-HGF)POF4-6G3 /
                      $G:(DE-HGF)2020_Join2-SWEDEN-DESY$},
      experiment   = {EXP:(DE-H253)P-P21.2-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:001397768500001},
      doi          = {10.1016/j.susc.2024.122693},
      url          = {https://bib-pubdb1.desy.de/record/627884},
}