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@ARTICLE{Volker:619244,
author = {Volker, Alexander and Schmidt, Janis Viktor and Dannheim,
Dominik and Svihra, Peter and Vicente Barreto Pinto, Mateus
and de Oliveira, Rui and Braach, Justus and Yang, Xiao and
Ruat, Marie and Magalhaes Suarez, Debora and Centis Vignali,
Matteo and Calderini, Giovanni and Kristiansen, Helge},
title = {{P}ixel detector hybridisation and integration with
anisotropic conductive adhesives},
journal = {Journal of Instrumentation},
volume = {19},
number = {05},
issn = {1748-0221},
address = {London},
publisher = {Inst. of Physics},
reportid = {PUBDB-2024-07502, arXiv:2312.09883},
pages = {C05024},
year = {2024},
note = {Procceding to IPRD23 conference in Siena 2023},
abstract = {A reliable and cost-effective interconnect technology is
required for the development ofhybrid pixel detectors. The
interconnect technology needs to be adapted for the pitch
and diesizes of the respective applications. This
contribution presents recent results of a newlydeveloped
in-house single-die interconnection process based on
Anisotropic Conductive Adhesives(ACA). The ACA interconnect
technology replaces solder bumps with conductive
micro-particlesembedded in an epoxy layer applied as either
film or paste. The electro-mechanical connectionbetween the
sensor and ASIC is achieved via thermocompression of the ACA
using a flip-chip devicebonder. The ACA technology can also
be used for ASIC-PCB/FPC integration, replacing wire
bondingor large-pitch solder bumping techniques. A specific
pixel-pad topology is required to enable theconnection via
micro-particles and create cavities into which excess epoxy
can flow. Thispixel-pad topology is achieved with an
in-house Electroless Nickel Immersion Gold (ENIG)process.
The ENIG and ACA processes are qualified with a variety of
different ASICs, sensors, anddedicated interconnect test
structures, with pad diameters ranging from 12 μm to 140
μmand pitches between 20 μm and 1.3 mm. The produced
assemblies are characterized electrically,with
radioactive-source exposures, and in tests with
high-momentum particle beams. Thiscontribution introduces
the developed interconnect and plating processes and
showcases differenthybrid assemblies produced and tested
with the above-mentioned methods. A focus is placed onrecent
optimization of the plating and interconnect processes,
resulting in an improved platinguniformity and interconnect
yield.},
cin = {FS-DS / $XFEL_DO_DD_DET$},
ddc = {610},
cid = {I:(DE-H253)FS-DS-20120731 /
$I:(DE-H253)XFEL_DO_DD_DET-20210408$},
pnm = {622 - Detector Technologies and Systems (POF4-622) /
AIDAinnova - Advancement and Innovation for Detectors at
Accelerators (101004761)},
pid = {G:(DE-HGF)POF4-622 / G:(EU-Grant)101004761},
experiment = {EXP:(DE-MLZ)NOSPEC-20140101},
typ = {PUB:(DE-HGF)16},
eprint = {2312.09883},
howpublished = {arXiv:2312.09883},
archivePrefix = {arXiv},
SLACcitation = {$\%\%CITATION$ = $arXiv:2312.09883;\%\%$},
UT = {WOS:001228261500001},
doi = {10.1088/1748-0221/19/05/C05024},
url = {https://bib-pubdb1.desy.de/record/619244},
}