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| Home > Publications database > Generation of ultrafast laser pulses at the SXP instrument of the European XFEL |
| Contribution to a conference proceedings/Contribution to a book | PUBDB-2023-08113 |
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2023
Optica Publishing Group
[Washington, D.C., USA]
ISBN: 979-8-3503-4599-5
Abstract: At the European X-ray Free Electron Laser (XFEL) facility a new instrument, the Soft X-ray Port (SXP), is currently under commissioning [1]. It is primarily designed for time- and spin-resolved X-ray photo-electron spectroscopy (TR-XPES), but investigations of complex chemical and bio-inorganic molecular systems with fluorescence spectroscopy as well as research on highly charged ions are also envisioned [2]. SXP is located downstream of the SASE 3 soft X-ray undulator system providing ultrafast photon pulses with variable polarization in the energy range between 260 eV and 3000 eV, at MHz repetition rates. Up to 1012 photons per pulse will be focus at the interaction region in a micrometer spot size resulting in an intensity of more than 1018 W/cm2. These outstanding specifications will enable the complete electronic, chemical and atomic characterization of solids, surfaces and interfaces using TR-XPES. For this purpose, two powerful pump-probe lasers operating in a broad spectral range from the mid-infrared to the ultraviolet region will be available. Herriott-type multi pass cells (MPC) will be used to compress their pulses into the few femtosecond range paving the way for ultrafast time-resolved investigations at the SXP instrument combining intense and tunable soft X-rays with versatile optical laser capabilities.
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