Trap‐Assisted Memristive Switching in HfO$_2$ ‐Based Devices Studied by In Situ Soft and Hard X‐Ray Photoelectron Spectroscopy

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Trap‐Assisted Memristive Switching in HfO$_2$ ‐Based Devices Studied by In Situ Soft and Hard X‐Ray Photoelectron Spectroscopy - PUBDB-2023-07307

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